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Development of New Materials and Manufacturing Processes

Metrology for Process Control and Quality Assurance in Manufacturing

Multiscale and Multimodal Metrology to Advance Degradation Science

Data-Centric Approaches to Promote Energy Affordability and Resilience

Click any topic below to expand it. Publication codes (J = journal article, C = conference paper, I = invited presentation, NR = report, B = book chapter, P = patent) link to entries on the Publications page, and each topic links to the related Research Projects pages.


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Development of New Materials and Manufacturing Processes

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We develop new thin films, interfaces and metallization processes for high-efficiency silicon photovoltaics, with an emphasis on scalable, low-cost deposition and printing methods that industry can adopt.

Multifunctional Nanomaterials for Photon Management and Surface Passivation

Atmospheric Pressure Chemical Vapor Deposition of Doped Polysilicon for TOPCon Photovoltaic Cells

Passivating, Carrier-Selective Contacts Formed by Atomic Layer Deposition of Metal Oxides

High Conductivity Metallization Formed by Photonic Curing and Sintering of Metal Pastes


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Metrology for Process Control and Quality Assurance in Manufacturing

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We develop measurement methods that tell cell and module manufacturers not only how well a device performs, but where and why it loses power, so that process problems can be found and fixed quickly.

Spatially-Resolved Characterization of Photovoltaic Cells

Comprehensive, High-Throughput Metrology for Photovoltaic Cell Manufacturing


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Multiscale and Multimodal Metrology to Advance Degradation Science

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We study why photovoltaic modules and other electronic systems lose performance over time, linking what is seen at the scale of a power plant down to changes in chemistry and microstructure at the scale of a single metal contact.

Spatial and Semantic Performance Analysis of Photovoltaic Module Performance

Multiscale Characterization of Materials Degradation in Photovoltaics

Data-Driven, Accelerated Screening of Metal Contact Degradation Susceptibility